Journal
JOURNAL OF APPLIED PHYSICS
Volume 115, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4868338
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Funding
- MOE Tier 1 Grant [RG 43/12]
- Si COE Program
- NSFC [61274086]
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Dielectric function, band gap, and exciton binding energies of ultrathin ZnO films as a function of film thickness have been obtained with spectroscopic ellipsometry. As the film thickness decreases, both real (epsilon(1)) and imaginary (epsilon(2)) parts of the dielectric function decrease significantly, and epsilon(2) shows a blue shift. The film thickness dependence of the dielectric function is shown related to the changes in the interband absorption, discrete-exciton absorption, and continuum-exciton absorption, which can be attributed to the quantum confinement effect on both the band gap and exciton binding energies. (C) 2014 AIP Publishing LLC.
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