Journal
JOURNAL OF APPLIED PHYSICS
Volume 115, Issue 4, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4863120
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Funding
- National Science Foundation: DMR [1108071]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1108071] Funding Source: National Science Foundation
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We demonstrate the use of anomalous x-ray scattering of constituent cations at their absorption edge, in a conventional Bragg-Brentano diffractometer, to measure absolutely and quantitatively the polar orientation and polarity fraction of unipolar and mixed polar wurtzitic crystals. In one set of experiments, the gradual transition between c+ and c- polarity of epitaxial ZnO films on sapphire as a function of MgO buffer layer thickness is monitored quantitatively, while in a second experiment, we map the polarity of a lateral polar homojunction in GaN. The dispersion measurements are compared with piezoforce microscopy images, and we demonstrate how x-ray dispersion and scanning probe methods can provide complementary information that can discriminate between polarity fractions at a material surface and polarity fractions averaged over the film bulk. (C) 2014 AIP Publishing LLC.
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