Journal
JOURNAL OF APPLIED PHYSICS
Volume 115, Issue 17, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4852135
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Funding
- U.S. Army Research Office [W911NF-12-1-0518, W911NF-11-C-0075]
- U.S. National Science Foundation [ECCS-1231598]
- U.S. National Institute of Standards and Technology [60NANB10D011]
- U.S. Department of Energy, Office of Basic Energy Sciences [DE-AC02-06CH11357]
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Growth of nm-thick yttrium iron garnet (YIG) films by sputtering and ferromagnetic resonance (FMR) properties in the films were studied. The FMR linewidth of the YIG film decreased as the film thickness was increased from several nanometers to about 100 nm. For films with very smooth surfaces, the linewidth increased linearly with frequency. In contrast, for films with big grains on the surface, the linewidth-frequency response was strongly nonlinear. Films in the 7-26 nm thickness range showed a surface roughness between 0.1 nm and 0.4nm, a 9.48-GHz FMR linewidth in the 6-10Oe range, and a damping constant of about 0.001. (C) 2014 AIP Publishing LLC.
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