Journal
JOURNAL OF APPLIED PHYSICS
Volume 114, Issue 18, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4829695
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Funding
- Army Research Office [W911NF-10-1-0220]
- Ohio State University Center for Emergent Materials, a National Science Foundation Materials Research and Engineering Center under NSF [DMR-0820414]
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We used a complement of photoemission and cathodoluminescence techniques to measure formation of the BaTiO3 (BTO) on SrTiO3 (STO) heterojunction band offset grown monolayer by monolayer by molecular beam epitaxy. X-ray photoemission spectroscopy (XPS) provided core level and valence band edge energies to monitor the valence band offset in-situ as the first few crystalline BTO monolayers formed on the STO substrate. Ultraviolet photoemission spectroscopy (UPS) measured Fermi level positions within the band gap, work functions, and ionization potentials of the growing BTO film. Depth-resolved cathodoluminescence spectroscopy measured energies and densities of interface states at the buried heterojunction. Kraut-based XPS heterojunction band offsets provided evidence for STO/BTO heterojunction linearity, i.e., commutativity and transitivity. In contrast, UPS and XPS revealed a large dipole associated either with local charge transfer or strain-induced polarization within the BTO epilayer. (c) 2013 AIP Publishing LLC.
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