Effect of disorder on carrier transport in ZnO thin films grown by atomic layer deposition at different temperatures

We have grown similar to 200 nm thick ZnO films on (0001) sapphire substrates using atomic layer deposition at different substrate temperatures ranging from similar to 150 to 350 degrees C. X-ray diffraction and photoluminescence spectra of these films showed that crystalline and compositional native defects were strongly dependent on the substrate temperature. Room temperature Hall measurement showed that all the films were degenerate with carrier concentration exceeding the Mott's critical density n(c) required for metallic conduction. The lowest value of room temperature resistivity similar to 3.6 x 10(-3) Omega cm was achieved for the film deposited at similar to 200 degrees C, which had an estimated carrier concentration similar to 5.7 x 10(-19) cm(-3) and mobility similar to 30 cm(2)/V s. The films deposited both below and above similar to 200 degrees C showed increased resistivity and decreased mobility presumably due to the intensified defects and deteriorated crystalline quality of these films. To investigate the effect of disorder on the underlying charge transport mechanisms in these films, the electrical resistivity was measured in the temperature range of similar to 4.2 to 300 K. The films grown at similar to 150, 300, and 350 degrees C were found to be semiconducting in the entire range of the measurement temperature due to the intensified disorder which impeded the metallic transport in these films. However, the films grown at similar to 200 and 250 degrees C showed a transition from metallic to semiconducting transport behaviour at lower temperatures due to the reduced defects and improved crystalline quality of these films. The observed semiconducting behaviour below the transition temperature for these films could be well explained by considering quantum corrections to the Boltzmann conductivity which includes the effect of disorder induced weak localization and coulomb electron-electron interactions. (C) 2013 AIP Publishing LLC.