Journal
JOURNAL OF APPLIED PHYSICS
Volume 112, Issue 12, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.4769799
Keywords
-
Categories
Ask authors/readers for more resources
CdS nanofilms of varying thickness (t) deposited by chemical bath deposition technique have been studied for structural changes using x-ray diffractometer (XRD) and transmission electron microscope (TEM). XRD analysis shows polycrystalline nature in deposited films with preferred orientation along (002) reflection plane also confirmed by selected area diffraction pattern of TEM. Uniform and smooth surface morphology observed using field emission scanning electron microscope. The surface topography has been studied using atomic force microscope. The optical constants have been calculated from the analysis of %T and %R spectra in the wavelength range 300 nm-900 nm. CdS nanofilms show a direct transition with red shift. The optical band gap decreases while the refractive index increases with increase in thickness of nanofilms. (c) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4769799]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available