Journal
JOURNAL OF APPLIED PHYSICS
Volume 107, Issue 9, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3337684
Keywords
-
Categories
Ask authors/readers for more resources
FeZrN thin films with in-plane anisotropy were deposited on both rigid substrate (Si) and flexible substrate (Kapton) by magnetron sputtering. The as-prepared films had the microstructure of nanocrystallites with a small amount of intergranular amorphous phase. The thickness dependent coercivity showed different behaviors for flexible and rigid films. The dynamic magnetic properties of the films have been characterized. Although the high frequency characteristics are closely related to the thickness, composition, and anisotropy, the flexible films have relatively smaller values of real permeability mu' but larger values of ferromagnetic resonance frequency f(r) than the rigid films. Due to the flexibility, the properties of the flexible films varied with each other. Nevertheless, both rigid and flexible films can find important applications in microwave absorber due to their excellent high frequency properties up to 5 GHz. (C) 2010 American Institute of Physics. [doi:10.1063/1.3337684]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available