4.6 Article

Ellipsometry of graphene on a substrate

Journal

JOURNAL OF APPLIED PHYSICS
Volume 107, Issue 3, Pages -

Publisher

AIP Publishing
DOI: 10.1063/1.3295913

Keywords

elemental semiconductors; graphene; Maxwell equations; monolayers; narrow band gap semiconductors; optical conductivity; reflectivity; semiconductor thin films; tensors

Ask authors/readers for more resources

Monolayer graphene deposited on a dielectric substrate material is investigated theoretically using Maxwell's equations to study its optical properties. Optical quantities such as reflected polarization and reflection coefficient are important since they are able to provide information about the conductivity tensor of the graphene layer. This study can be considered as a general one which gives the suspended graphene as its limiting case. The focus of this study is the effect of substrate on graphene (suspended) optical properties for which a comparison between the suspended graphene and graphene on substrate is made here at each stage. An investigation of the reflection coefficient reveals the presence of Brewster's-like phenomena which is not observable in suspended graphene.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.6
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available