Related references
Note: Only part of the references are listed.Biased-probe-induced water ion injection into amorphous polymers investigated by electric force microscopy
Nikolaus Knorr et al.
JOURNAL OF APPLIED PHYSICS (2009)
Charge trapping at the dielectric of organic transistors visualized in real time and space
Simon G. J. Mathijssen et al.
ADVANCED MATERIALS (2008)
Surface charge decay on insulators in air and sulfurhexafluorid - Part II: Measurements
Josef Kindersberger et al.
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION (2008)
Surface charge decay on insulators in air and sulfurhexafluorid - Part I: Simulation
Josef Kindersberger et al.
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION (2008)
Characterisation of trapped electric charge carriers behaviour at nanometer scale by electrostatic force microscopy
F. Marchi et al.
JOURNAL OF ELECTROSTATICS (2008)
Water Vapor Adsorption Effect on Silica Surface Electrostatic Patterning
Rubia F. Gouveia et al.
JOURNAL OF PHYSICAL CHEMISTRY C (2008)
Electrostatic nanopatterning of PMMA by AFM charge writing for directed nano-assembly
L. Ressier et al.
NANOTECHNOLOGY (2008)
Feed-forward compensation of surface potential in atomic force microscopy
Dominik Ziegler et al.
REVIEW OF SCIENTIFIC INSTRUMENTS (2008)
Water activated ionic conduction in cross-linked polyelectrolytes
N. Camaioni et al.
SENSORS AND ACTUATORS B-CHEMICAL (2008)
Charge trapping properties at silicon nitride/silicon oxide interface studied by variable-temperature electrostatic force microscopy
S. -D. Tzeng et al.
JOURNAL OF APPLIED PHYSICS (2006)
Experimental analysis of the stability of electrostatic bits for assisted nano-assembly
A Palaria et al.
JOURNAL OF ELECTROSTATICS (2006)
Charge transport modeling in insulating polymers: From molecular to macroscopic scale
G Teyssedre et al.
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION (2005)
Persistent microscopic charge patterns in amorphous silicon thin films for guided assembly of colloids
B Rezek et al.
JOURNAL OF NON-CRYSTALLINE SOLIDS (2005)
Charging process and coulomb-force-directed printing of nanoparticles with sub-100-nm lateral resolution
CR Barry et al.
NANO LETTERS (2005)
Measuring and modeling transient insulator response to charging:: the contribution of surface potential studies
P Molinié
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION (2005)
Space charge phenomenology in polymeric insulating materials
GC Montanari et al.
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION (2005)
Dispersive charge transport along the surface of an insulating layer observed by electrostatic force microscopy -: art. no. 155418
J Lambert et al.
PHYSICAL REVIEW B (2005)
Water sorption in polymer electrolytes: kinetics of the conductance variation
G Casalbore-Miceli et al.
SENSORS AND ACTUATORS B-CHEMICAL (2005)
Electrostatic patterning of a silica surface: A new model for charge build-up on a dielectric solid
RF Gouveia et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2005)
Accuracy and resolution limits of Kelvin probe force microscopy -: art. no. 125424
U Zerweck et al.
PHYSICAL REVIEW B (2005)
Surface resistivity of uncoated insulators
AE Seaver
JOURNAL OF ELECTROSTATICS (2005)
Stable charge storage in granular thin films
FTT Xu et al.
APPLIED PHYSICS LETTERS (2005)
New methodology for surface potential decay measurements:: Application to study charge injection dynamics on polypropylene films
P Llovera et al.
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION (2004)
Nonvolatile organic field-effect transistor memory element with a polymeric gate electret
TB Singh et al.
APPLIED PHYSICS LETTERS (2004)
Electric force microscopy of individually charged nanoparticles on conductors: An analytical model for quantitative charge imaging
T Melin et al.
PHYSICAL REVIEW B (2004)
Visualizing charge transport in silicon nanocrystals embedded in SiO2 films with electrostatic force microscopy
CY Ng et al.
APPLIED PHYSICS LETTERS (2004)
Imaging the charge transport in arrays of CdSe nanocrystals
M Drndic et al.
APPLIED PHYSICS LETTERS (2003)
Charge motion in technical insulators: Facts, fancies and simulations
HJ Wintle
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION (2003)
A tool for studying contact electrification in systems comprising metals and insulating polymers
JA Wiles et al.
ANALYTICAL CHEMISTRY (2003)
Charge storage in undoped hydrogenated amorphous silicon by ambient atomic force microscopy
B Rezek et al.
APPLIED PHYSICS LETTERS (2003)
Easily processable phenylene-thiophene-based organic field-effect transistors and solution-fabricated nonvolatile transistor memory elements
M Mushrush et al.
JOURNAL OF THE AMERICAN CHEMICAL SOCIETY (2003)
Relationship between charge distribution and its image by electrostatic force microscopy
J Lambert et al.
JOURNAL OF APPLIED PHYSICS (2003)
Quantitative noncontact electrostatic force Imaging of nanocrystal polarizability
O Cherniavskaya et al.
JOURNAL OF PHYSICAL CHEMISTRY B (2003)
Charge injection in individual silicon nanoparticles deposited on a conductive substrate
T Mélin et al.
APPLIED PHYSICS LETTERS (2002)
Charge imaging and manipulation using carbon nanotube probes
SD Tzeng et al.
APPLIED PHYSICS LETTERS (2002)
Imaging of stored charges in Si quantum dots by tapping and electrostatic force microscopy
C Guillemot et al.
EUROPHYSICS LETTERS (2002)
Permanent polarization and charge injection in thin anodic alumina layers studied by electrostatic force microscopy
J Lambert et al.
JOURNAL OF APPLIED PHYSICS (2002)
Potential shielding by the surface water layer in Kelvin probe force microscopy
H Sugimura et al.
APPLIED PHYSICS LETTERS (2002)
Probe diameter and probe-specimen distance dependence in the lateral resolution of a scanning Kelvin probe
HN McMurray et al.
JOURNAL OF APPLIED PHYSICS (2002)
Charge writing on the nanometre scale in a fluorocarbon film
P Mesquida et al.
SURFACE AND INTERFACE ANALYSIS (2002)
Organic field-effect transistors with polarizable gate insulators
HE Katz et al.
JOURNAL OF APPLIED PHYSICS (2002)
Real-time evolution of trapped charge in a SiO2 layer:: An electrostatic force microscopy study
GH Buh et al.
APPLIED PHYSICS LETTERS (2001)
Localized charge injection in SiO2 films containing silicon nanocrystals
EA Boer et al.
APPLIED PHYSICS LETTERS (2001)
Surface-potential decay of disordered solids
W Tomaszewicz
JOURNAL OF ELECTROSTATICS (2001)
Submicrometer patterning of charge in thin-film electrets
HO Jacobs et al.
SCIENCE (2001)
Charge stability on thin insulators studied by atomic force microscopy
N Felidj et al.
EUROPEAN PHYSICAL JOURNAL-APPLIED PHYSICS (2000)
Share Paper
