Journal
JOURNAL OF APPLIED PHYSICS
Volume 105, Issue 7, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3106528
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Funding
- Ministry of Education, Culture, Sports, Science and Technology, Japan [20560290]
- Grants-in-Aid for Scientific Research [20560290] Funding Source: KAKEN
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Optical properties of white tin (beta-Sn) have been investigated using spectroscopic ellipsometry in the photon-energy range between 0.6 and 6.5 eV at room temperature. The beta-Sn films are deposited by vacuum evaporation on Si(001) substrates. The structural properties of the films are evaluated by x-ray diffraction and ex situ atomic force microscopy. The measured epsilon(E) spectra reveal distinct structures at several interband critical points in the Brillouin zone of beta-Sn. These spectra are analyzed on the basis of a simplified model of the interband transitions, including the free-carrier absorption between the filled and empty electronic states. Dielectric-related optical constants, such as the complex refractive index, absorption coefficient, and normal-incidence reflectivity, of bulk beta-Sn films are also presented. (C) 2009 American Institute of Physics. [DOI:10.1063/1.3106528]
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