Journal
JOURNAL OF APPLIED PHYSICS
Volume 105, Issue 1, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3056138
Keywords
-
Categories
Ask authors/readers for more resources
Epitaxial (100)/(001)-oriented tetragonal Pb(Zr, Ti)O-3 films above 1 mu m thick were grown on (100)SrTO3 substrates by pulsed metal organic chemical vapor deposition, and the films with Zr/(Zr+Ti) ratios up to 0.43 were found to have a strain-relaxed domain structure. The domain structure determined by the volume fraction of (001) orientation (mainly decided by the thermal strain above the Curie temperature) and the lattice parameters dependent on the Zr/(Zr+Ti) ratio are explained by a geometrical model consistent with previous results for PbTiO3 films [J. Appl. Phys. 104, 064121 (2008)]. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3056138]
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available