Journal
JOURNAL OF APPLIED PHYSICS
Volume 106, Issue 7, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3239516
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Funding
- BMBF [05KS4KTB/3, 05ES3XBA/5]
- EFRE [B715-08015]
- European commission
- DFG
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The dielectric function (DF) of phase-pure cubic AlN films is determined by ellipsometry. The sharp onset of the imaginary part of the DF defines the direct absorption edge corresponding to a conduction-to-valence band spacing at the center of the Brillouin zone (BZ) of 5.93 eV. Phonon-assisted transitions lead to the pronounced absorption tail below this edge from which the indirect gap of zinc-blende AlN is estimated with 5.3 eV. Transitions due to four additional critical points of the BZ are resolved at higher photon energies. The high-frequency and static dielectric constants are determined with 4.25 and 8.07, respectively. (C) 2009 American Institute of Physics. [doi:10.1063/1.3239516]
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