Journal
JOURNAL OF APPLIED PHYSICS
Volume 105, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3126708
Keywords
carbon nanotubes; scanning probe microscopy; temperature distribution; thermal conductivity; thermal diffusivity
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Funding
- Department of Energy [DE-FG02-07ER46377]
- National Science Foundation
- Texas Higher Education Coordinating Board Norman Hackerman Advanced Research Program
- U.S. Department of Energy (DOE) [DE-FG02-07ER46377] Funding Source: U.S. Department of Energy (DOE)
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The temperature distributions in current-carrying carbon nanotubes have been measured with a scanning thermal microscope. The obtained temperature profiles reveal diffusive and dissipative electron transport in multiwalled nanotubes and in single-walled nanotubes when the voltage bias was higher than the 0.1-0.2 eV optical phonon energy. Over 90% of the Joule heat in a multiwalled nanotube was found to be conducted along the nanotube to the two metal contacts. In comparison, about 80% of the Joule heat was transferred directly across the nanotube-substrate interface for single-walled nanotubes. The average temperature rise in the nanotubes is determined to be in the range of 5-42 K per microwatt Joule heat dissipation in the nanotubes.
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