Journal
JOURNAL OF APPLIED PHYSICS
Volume 105, Issue 10, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3115639
Keywords
diffraction gratings; light interferometry; X-ray imaging; X-ray optics
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Funding
- DFG Cluster of Excellence Munich-Center for Advanced Photonics
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In this letter, we report results obtained with a recently developed approach for grating-based x-ray dark-field imaging [F. Pfeiffer , Nat. Mater. 7, 134 (2008)]. Since the image contrast is formed through the mechanism of small-angle scattering, it provides complementary and otherwise inaccessible structural information about the specimen at the micron and submicron length scales. Our approach is fully compatible with conventional transmission radiography and the grating-based hard x-ray phase-contrast imaging scheme [F. Pfeiffer , Nat. Phys. 2, 258 (2006)]. Since it can be used with standard x-ray tube sources, we envisage widespread applications to x-ray medical imaging, industrial nondestructive testing, or security screening.
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