Journal
JOURNAL OF APPLIED PHYSICS
Volume 106, Issue 2, Pages -Publisher
AMER INST PHYSICS
DOI: 10.1063/1.3079520
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- French National Research Agency ANR [Blanc 07-1-193024]
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Using the dielectric resonator method, we have investigated nonlinearities in the surface impedance Z(s)=R-s+jX(s) of YBa2Cu3O7-delta thin films at 10 GHz as a function of the incident microwave power level and temperature. The use of a rutile dielectric resonator allows us to measure the precise temperature of the films. We conclusively show that the usually observed increase in the surface resistance of YBa2Cu3O7-delta thin film as a function of microwave power is due to local heating. (C) 2009 American Institute of Physics. [DOI: 10.1063/1.3079520]
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