4.6 Article

Formation of defects in boron nitride by low energy ion bombardment

Journal

JOURNAL OF APPLIED PHYSICS
Volume 106, Issue 8, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.3253576

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Funding

  1. Ministry of Science, Education and Sports of the Republic of Croatia [009-0982886-0542]

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Formation of defects in hexagonal and cubic boron nitride (h-BN and c-BN, respectively) under low-energy argon or nitrogen ion-bombardment has been studied by near-edge x-ray absorption fine structure (NEXAFS) around boron and nitrogen K-edges. Breaking of B-N bonds for both argon and nitrogen bombardment and formation of nitrogen vacancies, V-N, has been identified from the B K-edge of both h-BN and c-BN, followed by the formation of molecular nitrogen, N-2, at interstitial positions. The presence of N-2 produces an additional peak in photoemission spectra around N 1s core level and a sharp resonance in the low-resolution NEXAFS spectra around N K-edge, showing the characteristic vibrational fine structure in high-resolution measurements. In addition, several new peaks within the energy gap of BN, identified by NEXAFS around B and N K-edges, have been assigned to boron or nitrogen interstitials, in good agreement with theoretical predictions. Ion bombardment destroys the cubic phase of c-BN and produces a phase similar to a damaged hexagonal phase. (C) 2009 American Institute of Physics. [doi:10.1063/1.3253576]

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