Fourier crystal diffractometry based on refractive optics

X-ray refractive lenses are proposed as a Fourier transformer for high-resolution X-ray crystal diffraction. By employing refractive lenses the wave transmitted through the object converts into a spatial intensity distribution at its back focal plane according to the Fourier-transform relations. A theoretical consideration of the Fourier-transform technique is presented. Two types of samples were studied in Bragg reflection geometry: a grating made of strips of a thin SiO2 film on an Si substrate and a grating made by profiling an Si crystal. Fourier patterns recorded at different angles along the rocking curves of the Si 111 Bragg reflection were analysed. (C) 2013 International Union of Crystallography Printed in Singapore - all rights reserved