Related references
Note: Only part of the references are listed.Nanodiffraction at MINAXS (P03) beamline of PETRA III
C. Krywka et al.
11TH INTERNATIONAL CONFERENCE ON SYNCHROTRON RADIATION INSTRUMENTATION (SRI 2012) (2013)
A two-dimensional waveguide beam for X-ray nanodiffraction
Christina Krywka et al.
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2012)
X-ray nanodiffraction reveals strain and microstructure evolution in nanocrystalline thin films
J. Keckes et al.
SCRIPTA MATERIALIA (2012)
Direct e-beam writing of dense and high aspect ratio nanostructures in thick layers of PMMA for electroplating
Sergey Gorelick et al.
NANOTECHNOLOGY (2010)
In situ diffraction strain analysis of elastically deformed polycrystalline thin films, and micromechanical interpretation
D. Faurie et al.
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2009)
A numerical simulation to relate the shot peening parameters to the induced residual stresses
T. Hong et al.
ENGINEERING FAILURE ANALYSIS (2008)
The materials science synchrotron beamline EDDI for energy-dispersive diffraction analysis
Ch. Genzel et al.
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT (2007)
Simultaneous determination of experimental elastic and thermal strains in thin films
J Keckes
JOURNAL OF APPLIED CRYSTALLOGRAPHY (2005)
X-ray residual stress analysis in thin films under grazing incidence - basic aspects and applications
C Genzel
MATERIALS SCIENCE AND TECHNOLOGY (2005)
Application of energy-dispersive diffraction to the analysis of multiaxial residual stress fields in the intermediate zone between surface and volume
C Genzel et al.
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING (2004)
Measurement of the elastic constants of textured anisotropic thin films from x-ray diffraction data
PO Renault et al.
APPLIED PHYSICS LETTERS (2003)
Nanofocusing parabolic refractive x-ray lenses
CG Schroer et al.
APPLIED PHYSICS LETTERS (2003)
Residual stress in fiber-textured thin films of cubic materials
P Scardi et al.
JOURNAL OF MATERIALS RESEARCH (2001)