Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 46, Issue -, Pages 1378-1385Publisher
WILEY-BLACKWELL
DOI: 10.1107/S0021889813019535
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Funding
- European Community [226716]
- Austrian Federal Government
- Styrian Provincial Government
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Novel scanning synchrotron cross-sectional nanobeam and conventional laboratory as well as synchrotron Laplace X-ray diffraction methods are used to characterize residual stresses in exemplary 11.5 mm-thick TiN coatings. Both real and Laplace space approaches reveal a homogeneous tensile stress state and a very pronounced compressive stress gradient in as-deposited and blasted coatings, respectively. The unique capabilities of the cross-sectional approach operating with a beam size of 100 nm in diameter allow the analysis of stress variation with sub-micrometre resolution at arbitrary depths and the correlation of the stress evolution with the local coating microstructure. Finally, advantages and disadvantages of both approaches are extensively discussed.
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