Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 43, Issue -, Pages 1415-1418Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889810041282
Keywords
XIPHOS; extreme sample environments; diffractometers; m-nitroaniline
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Funding
- EPSRC, UK [EP/C536436/1]
- NSERC
- Engineering and Physical Sciences Research Council [EP/C536436/1] Funding Source: researchfish
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XIPHOS has been developed to expand home laboratory facilities closer to those found at central facilities, offering extremes of sample environment and flux densities far greater than standard laboratory sources. The system has a minimum operating temperature of 1.9 K, and has a direct-drive molybdenum rotating-anode generator coupled with the latest multilayer optics. XIPHOS has been specifically designed to accommodate various sample environments and is now operational. Furthermore, it has been calibrated with structural phase transitions from 14 to 148 K. Results are also presented from a full low-temperature data collection of m-nitroaniline to demonstrate the quality of results attainable from XIPHOS.
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