4.5 Article

Ultra-small-angle X-ray scattering at the Advanced Photon Source

Journal

JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 42, Issue -, Pages 469-479

Publisher

WILEY-BLACKWELL PUBLISHING, INC
DOI: 10.1107/S0021889809008802

Keywords

ultra-small-angle X-ray scattering (USAXS); Advanced Photon Source (APS)

Funding

  1. National Institute of Standards and Technology for the University-National Laboratory-Industry Collaborative Access Team (UNICAT)
  2. US Department of Energy
  3. Office of Science
  4. Office of Basic Energy Sciences [DE-AC02-06CH11357]

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The design and operation of a versatile ultra-small-angle X-ray scattering (USAXS) instrument at the Advanced Photon Source (APS) at Argonne National Laboratory are presented. The instrument is optimized for the high brilliance and low emittance of an APS undulator source. It has angular and energy resolutions of the order of 10(-4), accurate and repeatable X-ray energy tunability over its operational energy range from 8 to 18 keV, and a dynamic intensity range of 10(8) to 10(9), depending on the configuration. It further offers quantitative primary calibration of X-ray scattering cross sections, a scattering vector range from 0.0001 to 1 angstrom(-1), and stability and reliability over extended running periods. Its operational configurations include one-dimensional collimated (slit-smeared) USAXS, two-dimensional collimated USAXS and USAXS imaging. A robust data reduction and data analysis package, which was developed in parallel with the instrument, is available and supported at the APS.

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