Journal
JOURNAL OF APPLIED CRYSTALLOGRAPHY
Volume 42, Issue -, Pages 369-375Publisher
INT UNION CRYSTALLOGRAPHY
DOI: 10.1107/S0021889809009145
Keywords
grazing-incidence diffraction; reciprocal-space mapping; nanowires
Categories
Ask authors/readers for more resources
Grazing-incidence X-ray diffraction is combined with a two-dimensional pixel detector to obtain three-dimensional reciprocal-space maps of InAs nanowires grown by molecular beam epitaxy. This rapid data-acquisition technique and the necessary correction factors are described in general terms, as well as for the specific setup used, for which a resolution of similar to 2 x 10(-3) angstrom is computed. The three-dimensional data sets are obtained by calculating the reciprocal space coordinates for every pixel in the detected images, and are used to map the diffuse scattering from the nanowires as both two-dimensional reciprocal-space maps and three-dimensional isosurfaces. The InAs nanowires are shown to consist mainly of wurtzite crystal with a c/a ratio of 1.641. The diffuse scattering reveals two different facet structures, both resulting in hexagonal cross sections of the nanowires.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available