Journal
JOURNAL OF ANALYTICAL ATOMIC SPECTROMETRY
Volume 24, Issue 8, Pages 1111-1114Publisher
ROYAL SOC CHEMISTRY
DOI: 10.1039/b816804k
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- Netherlands Organisation for Scientific Research (NWO/ALW) [175.107.404.01]
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Sample preparation methods for MC-ICP-MS silicon-isotope measurements often involve a cation-xchange purification step. A previous study has argued that this would suffice for geological materials, as the occasional enrichment of anionic species would not compromise silicon-isotope analysis. Here we report significant offsets in MC-ICP-MS silicon-isotope measurements induced by the presence of sulfur. We show that offsets in delta Si-30 become significant above SO4/Si ratios (wt.) of 0.02, reaching up to ca. + 1.4 parts per thousand at SO4/Si ratios above similar to 0.2. This finding is particularly relevant for studies of sulfur-rich waters and silicified rocks where alteration was accompanied by sulfur-enrichments. We propose an additional purification step to remove sulfur from solid sample material.
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