4.7 Article

Coexistence of the bipolar and unipolar resistive switching behaviors in vanadium doped ZnO films

Journal

JOURNAL OF ALLOYS AND COMPOUNDS
Volume 584, Issue -, Pages 269-272

Publisher

ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2013.09.073

Keywords

Vanadium-doped ZnO thin film; Unipolar switching; Bipolar switching

Funding

  1. Key Project of National Natural Science Foundation of China (NSFC) [11032010]
  2. NSFC [51072171, 61274107, 61176093, 11275163]
  3. PCSIRT [IRT1080]
  4. 973 Program [2012CB326404]
  5. Key Project of Hunan Provincial NSFC [13JJ2023]
  6. Key Project of Scientific Research Fund of Hunan Provincial Education Department [12A129]
  7. Doctoral Program of Higher Education of China [20104301110001]
  8. Aid Program for Science and Technology Innovative Research Team in Higher Educational Institutions of Hunan Province
  9. Opening Project of Science and Technology on Reliability Physics and Application Technology of Electronic Component Laboratory [ZHD201304]

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The coexistence of bipolar and unipolar resistive switching (BRS and URS) modes are observed in the vanadium doped ZnO polycrystalline thin films fabricated by a sol-gel method. These two switching modes can be activated separately depending on the different compliance current (I-cc) during the first voltage sweeping process: the fabricated device shows reproducible BRS behavior with a low compliance current I-cc = 0.1 mA, while with a high I-cc = 0.01 A, URS behavior was observed after electroforming. The conversion between BRS and URS is reversible. The conducting filament formation/rupture models with electrochemical redox reactions and thermal effects were suggested to explain the BRS and URS behaviors respectively. (C) 2013 Elsevier B. V. All rights reserved.

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