Journal
JOURNAL OF ALLOYS AND COMPOUNDS
Volume 479, Issue 1-2, Pages 821-827Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.jallcom.2009.01.051
Keywords
Semiconductors; Chemical synthesis; X-ray diffraction; Scanning and transmission electron microscopy
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V2O5/BiVO4 composite photocatalysts were prepared by the one-step solution combustion synthesis method. X-ray diffraction, X-ray photoelectron spectroscopy, field-emission scanning electron microscopy and UV-visible diffusion reflectance spectroscopy were used to identify the physical properties and photophysical properties Of V2O5/BiVO4 composite photocatalysts. The composite photocatalysts exhibit the enhanced photocatalytic properties for degradation of methylene blue. The mechanism of improved photocatalytic activity is also discussed. (C) 2009 Elsevier B.V. All rights reserved.
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