☆ 4.3 Article

Mapping Characterization of SnO2:F Transparent Conductive Oxide Layers by Ellipsometry Technique

JAPANESE JOURNAL OF APPLIED PHYSICS (2013)

Journal

JAPANESE JOURNAL OF APPLIED PHYSICS

Volume 51, Issue 10S, Pages 10NB01

Publisher

Japan Society of Applied Physics

DOI: 10.7567/jjap.51.10nb01

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Categories

Physics, Applied

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