4.3 Article

Electron Transport Properties in HSi(OC2H5)3 Vapor

Journal

JAPANESE JOURNAL OF APPLIED PHYSICS
Volume 50, Issue 12, Pages -

Publisher

IOP PUBLISHING LTD
DOI: 10.1143/JJAP.50.120210

Keywords

-

Funding

  1. Grants-in-Aid for Scientific Research [21249065] Funding Source: KAKEN

Ask authors/readers for more resources

The electron swarm parameters in HSi(OC2H5)(3) (triethoxysilane, TRIES) vapor have been investigated for relatively wide ranges of reduced electric field (E/N). Based on the arrival-time spectra (ATS) method for electrons using a double-shutter drift tube, the drift velocity and the longitudinal diffusion coefficient were measured for the E/N = 20-5000 Td, and the ionization coefficient was obtained for E/N 300-5000 Td. The results were compared with those for SiH4 and Si(OC2H5)(4) (tetraethoxysilane, TEOS), to show characteristics similar to the parameters in TEOS. We also determined the electron collision cross sections for TRIES by means of the Boltzmann equation analysis. (C) 2011 The Japan Society of Applied Physics

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.3
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available