Journal
INTERNATIONAL JOURNAL OF SOLIDS AND STRUCTURES
Volume 45, Issue 10, Pages 3107-3121Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ijsolstr.2008.01.023
Keywords
finite deformation; buckling; thin film; perturbation analysis; finite element analysis
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A finite-deformation theory is developed to study the mechanics of thin buckled films on compliant substrates. Perturbation analysis is performed for this highly nonlinear system to obtain the analytical solution. The results agree well with experiments and finite element analysis in wavelength and amplitude. In particular, it is found that the wavelength depends on the strain. Based on the accurate wavelength and amplitude, the membrane and peak strains in thin films, and stretchability and compressibility of the system are also obtained analytically. (c) 2008 Elsevier Ltd. All rights reserved.
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