Journal
INTERNATIONAL JOURNAL OF MULTIPHASE FLOW
Volume 36, Issue 10, Pages 825-835Publisher
PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ijmultiphaseflow.2010.02.002
Keywords
Film thickness; Vertical flow; Annular flow; Fluorescence
Categories
Funding
- Bettis Laboratory
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Film thickness distributions in upward vertical air-water annular flow have been determined using planar laser-induced fluorescence (PLIF). Film thickness data are frequently used to estimate interfacial shear and pressure loss. This film roughness concept has been used in a number of models for annular flow of varying complexity. The PLIF data are presently applied to the single-zone interfacial shear correlation of Wallis; the more detailed model of Owen and Hewitt: and the two-zone (base film and waves) model of Hurlburt, Fore, and Bauer. For the present data, these models all under-predict the importance of increasing liquid flow on pressure loss and interfacial shear. Since high liquid flow rates in annular flow induce disturbance wave and entrainment activity, further modeling in these areas is advised. (C) 2010 Elsevier Ltd. All rights reserved.
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