4.7 Article

Sensing properties of resistive-type hydrogen sensors with a Pd-SiO2 thin-film mixture

Journal

INTERNATIONAL JOURNAL OF HYDROGEN ENERGY
Volume 38, Issue 1, Pages 313-318

Publisher

PERGAMON-ELSEVIER SCIENCE LTD
DOI: 10.1016/j.ijhydene.2012.10.051

Keywords

Hydrogen; Mixture; Palladium; Resistance; Resistivity; Sensor

Funding

  1. National Science Council of the Republic of China [NSC 98-2221-E-019-052-My3, 101-2815-C-006-043-E]

Ask authors/readers for more resources

Zigzag-shaped pure-Pd thin film and Pd-SiO2 thin-film mixture as resistive-type hydrogen sensors were deposited on cover-glass substrates through a multiple-boat thermal evaporator. Temperature dependence of the resistance of the pure-Pd resistive-type sensor showed a relative sensitivity of 3.2% at 80 degrees C with a temperature coefficient of the resistance (TCR) of 0.058%/degrees C. Sensing properties of the Pd-SiO2 resistive-type sensor responding to the presence of 1% H-2/N-2 are much better than those of the pure-Pd one, including a higher relative sensitivity (9%-7.7%), a faster response time (10 s-30 s), and a lower detection concentration limit (50 ppm-100 ppm). A higher dissociation rate and a faster diffusion rate due to porous-like properties and more hydrogen atoms caught due to oxygen associated with the Pd-SiO2 thin-film mixture explain why the Pd-SiO2 resistive-type sensor has a higher relative sensitivity with a shorter response time. Copyright (C) 2012, Hydrogen Energy Publications, LLC. Published by Elsevier Ltd. All rights reserved.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.7
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available