Related references
Note: Only part of the references are listed.
Article
Engineering, Electrical & Electronic
Design of 2xVDD-tolerant mixed-voltage I/O buffer against gate-oxide reliability and hot-carrier degradation
Hui-Wen Tsai et al.
MICROELECTRONICS RELIABILITY (2010)
Article
Engineering, Electrical & Electronic
Overview and design of mixed-voltage I/O buffers, with low-voltage thin-oxide CMOS transistors
Ming-Dou Ker et al.
IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS I-REGULAR PAPERS (2006)
Share Paper
