Journal
INTEGRATED FERROELECTRICS
Volume 141, Issue 1, Pages 187-194Publisher
TAYLOR & FRANCIS LTD
DOI: 10.1080/10584587.2012.694748
Keywords
P(VDF-TrFE); annealing process; AFM; microstructure
Funding
- National Natural Science Foundation of China [61025021, 60936002, 60729308, 51072089]
- National Key Projects of Science, Technology [2009ZX02023-001-3]
- Ministry of Science and Technology of China [2008DFA12000]
- Foundation of State Key Laboratory of Electronic Thin Films and Integrated Devices, University of Electronic Science and Technology of China, Chengdu [KFJJ200904]
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Ferroelectric poly(vinylidene fluoride-trifluoroethylene) [P(VDF-TrFE)] (70/30) copolymer thin films were prepared by spin-coating method. The microstructure and morphology of P(VDF-TrFE) thin films annealed at different temperatures (70 degrees C-160 degrees C) were investigated by atom force microscope and X-ray diffraction techniques, which reveal the crystallization of P(VDF-TrFE) films is greatly affected by the annealing temperature. With the increase of annealing temperature, the grains of P(VDF-TrFE) thin film change from small spheroids to long needle-like structures. The most rapid change occurs between 136 degrees C-140 degrees C. The surface roughness and the grain size of P(VDF-TrFE) film show similar change with the annealing temperature.
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