Journal
IIE TRANSACTIONS
Volume 46, Issue 5, Pages 483-496Publisher
TAYLOR & FRANCIS INC
DOI: 10.1080/0740817X.2013.812270
Keywords
Dependent competing failure processes; changing degradation rate; generalized extreme shock model; generalized -shock model; generalized m-shock model; generalized run shock model
Funding
- USA National Science Foundation [0970140, 0969423]
- Div Of Civil, Mechanical, & Manufact Inn
- Directorate For Engineering [0969423, 0970140] Funding Source: National Science Foundation
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This article proposes reliability models for devices subject to dependent competing failure processes of degradation and random shocks with a changing degradation rate according to particular random shock patterns. The two dependent failure processes are soft failure due to continuous degradation, in addition to sudden degradation increases caused by random shocks, and hard failure due to the same shock process. In complex devices such as Micro-Electro-Mechanical Systems the degradation rate can change when the system becomes more susceptible to fatigue and deteriorates faster, as a result of withstanding shocks. This article considers four different shock patterns that can increase the degradation rate: (i) generalized extreme shock model: when the first shock above a critical value is recorded; (ii) generalized -shock model: when the inter-arrival time of two sequential shocks is less than a threshold ; (iii) generalized m-shock model: when m shocks greater than a critical level are recorded; and (iv) generalized run shock model: when there is a run of n consecutive shocks that are greater than a critical value. Numerical examples are presented to illustrate the developed reliability models, along with sensitivity analysis.
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