Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 635, Issue -, Pages 6-12Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2015.03.067
Keywords
Single crystal; Nanolayers; Incoherent interface; Pillar compression; Peak broadening; Dislocation saturation
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Funding
- Los Alamos National Laboratory (LANL)
- Office of Science, Office of Basic Energy Sciences, Materials Sciences Division, of the U.S. Department of Energy at Lawrence Berkeley National Laboratory and University of California, Berkeley, California [DE-AC02-05CH11231]
- NSF [0416243]
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In this study, the evolution of dislocation densities during compressive deformation of nanoscale Cu/Nb single crystal multilayers with individual layer thickness of 20 nm is investigated using Synchrotron X-ray micro-diffraction. The samples were subjected to successive compression straining up to a final cumulative strain of 35%. The nanolayer composite exhibited a maximum flow strength of similar to 1.6 GPa at approximately 24% compressive strain. Synchrotron X-ray micro-diffraction experiments, using a monochromatic beam of 10 keV energy were performed after each compression strain increment. We observed a significant increase in X-ray ring width peak broadening in both Cu and Nb layers up to strains of similar to 3.5% followed by saturation broadening at higher strains. This observation indicates that the interfaces of the Cu/Nb nanolayers are very effective in trapping and annihilating dislocation content during mechanical deformation. (C) 2015 Elsevier B.V. All rights reserved.
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