Related references
Note: Only part of the references are listed.A Wide-Range PLL Using Self-Healing Prescaler/VCO in 65-nm CMOS
I-Ting Lee et al.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS (2013)
Tunnel Field-Effect Transistors for Analog/Mixed-Signal System-on-Chip Applications
Abhijit Mallik et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2012)
Scalable Methods for Analyzing the Circuit Failure Probability Due to Gate Oxide Breakdown
Jianxin Fang et al.
IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS (2012)
Modeling and Simulation of Special Shaped SOI Materials for the Nanodevices Implementation
Cristian Ravariu et al.
JOURNAL OF NANOMATERIALS (2011)
A Nonlinear Order-Reducing Behavioral Modeling Approach for Microwave Oscillators
Michael Kraemer et al.
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES (2009)
The tunnel source (PNPN) n-MOSFET: A novel high performance transistor
Venkatagirish Nagavarapu et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2008)
Double-gate tunnel FET with high-κ gate dielectric
Kathy Boucart et al.
IEEE TRANSACTIONS ON ELECTRON DEVICES (2007)
From Psi-MOSFET with silicon on oxide to Psi-MOSFET with silicon carbide on nitride
C Ravariu et al.
DIAMOND AND RELATED MATERIALS (2002)
Share Paper
