Journal
MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING
Volume 621, Issue -, Pages 229-235Publisher
ELSEVIER SCIENCE SA
DOI: 10.1016/j.msea.2014.10.055
Keywords
Transmission electron microscope (TEM); Focused ion beam (FIB); Nanostructured materials; Interface; Shear testing; Composites
Categories
Funding
- National Science Foundation Materials World Network [DMR-1209928]
- Center for Integrated Nanotechnologies
- U.S. Department of Energy (DOE) Office of Science
- National Nuclear Security Administration
- U.S. Department of Energy [DE-AC52-06NA25396]
- Direct For Mathematical & Physical Scien
- Division Of Materials Research [1209928] Funding Source: National Science Foundation
Ask authors/readers for more resources
Nanolaminate composites show promise as high strength and toughness materials. However, due to the limited volume of these materials, micron scale mechanical testing methods must be used to determine the properties of these films. To this end, a novel approach combining a double notch shear testing geometry and compression with a flat punch in a nanoindenter was developed to determine the mechanical properties of these films under shear loading. To further elucidate the failure mechanisms under shear loading, in situ TEM experiments were performed using a double notch geometry cut into the TEM foil. Aluminum layer thicknesses of 50 nm and 100 nm were used to show the effect of constraint on the deformation. Higher shear strength was observed in the 50 nm sample (690 +/- 54 MPa) compared to the 100 nm sample (423 +/- 28.7 MPa). Additionally, failure occurred close to the Al-SiC interface in the 50 nm sample as opposed to failure within the Al layer in the 100 nm sample. (C) 2014 Elsevier B.V. All rights reserved.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available