Journal
IEEE TRANSACTIONS ON RELIABILITY
Volume 63, Issue 1, Pages 320-330Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TR.2014.2299497
Keywords
Binary decision diagram; fault tree; multiple-valued decision diagram; phased-mission system
Categories
Funding
- NSF of China [61272130]
- NSF of the U.S. [0832594]
- NSF of Zhejiang Province [Y1100689]
- China Scholarship Council [2011833135]
Ask authors/readers for more resources
Many practical systems are phased-mission systems (PMSs), where the mission consists of multiple, consecutive, and non-overlapping phases of operation. An accurate reliability analysis of a PMS must consider statistical dependence of component states across phases, as well as dynamics in system configurations, success criteria, and component behavior. This paper proposes a new method based on multiple-valued decision diagrams (MDDs) for the reliability analysis of a non-repairable binary-state PMS. Due to its multi-valued logic nature, the MDD model has recently been applied to the reliability analysis of multistate systems. In this work, we present a novel way to adapt MDDs for the reliability analysis of systems with multiple phases. Examples show how the MDD models are generated and evaluated to obtain the mission reliability measures. Performance of the MDD-based method is compared with an existing binary decision diagram (BDD)-based method for PMS analysis. Empirical results show that the MDD-based method can offer lower computational complexity as well as a simpler model construction and improved evaluation algorithms over those used in the BDD-based method.
Authors
I am an author on this paper
Click your name to claim this paper and add it to your profile.
Reviews
Recommended
No Data Available