Journal
IEEE TRANSACTIONS ON RELIABILITY
Volume 60, Issue 4, Pages 852-863Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TR.2011.2170254
Keywords
A fixed time period; degradation process; reliability analysis; shocks; varying time periods
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Funding
- National Natural Science Foundation of China [50775026]
- Research Fund for the Doctoral Program of Higher Education of China (New Faculty) [20100185120029]
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Product performance usually degrades with time. When shocks exist, the degradation could be more rapid. This research investigates the reliability analysis when typical degradation and shocks are involved. Three failure modes are considered: catastrophic (binary state) failure, degradation (continuous processes), and failure due to shocks (impulse processes). The overall reliability equation with three failure modes is derived. The effects of shocks on performance are classified into two types: a sudden increase in the failure rate after a shock, and a direct random change in the degradation after the occurrence of a shock. Two shock scenarios are considered. In the first scenario, shocks occur with a fixed time period; while in the second scenario, shocks occur with varying time periods. An engineering example is given to demonstrate the proposed methods.
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