4.3 Article

HiPIMS Ion Energy Distribution Measurements in Reactive Mode

Journal

IEEE TRANSACTIONS ON PLASMA SCIENCE
Volume 38, Issue 11, Pages 3089-3094

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TPS.2010.2073688

Keywords

Aluminum nitride; high-power impulse magnetron sputtering (HiPIMS); mass spectrometry

Funding

  1. Agence Nationale de la Recherche

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In this paper, mass spectrometry was used to measure the ion energy distributions of the main species during the sputtering of an aluminum target in a reactive Ar + N(2) mixture. Both conventional magnetron sputtering (dc) and high-power impulse magnetron sputtering (HiPIMS) were used. It appears that, in the HiPIMS, N(+) and Al(+) ions are significantly more energetic (up to 70 eV) than in the dc (< 40 eV). Furthermore, the HiPIMS Al(+) signal is two orders of magnitude greater than in the dc, and time-resolved measurements indicate that most of the ion flux hits the substrate during the OFF time of the impulse sequence.

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