Journal
IEEE TRANSACTIONS ON NUCLEAR SCIENCE
Volume 60, Issue 3, Pages 1852-1875Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TNS.2013.2255312
Keywords
Heavy ions; pulse laser; single-event effects; test circuits
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The application of pulsed lasers to the study of Single-Event Effects (SEEs) in integrated circuits and devices is described. The role of a pulsed laser is to provide spatial and temporal information about SEEs, information that is not available when broad-beam ion sources are used. A detailed description is given of the mechanisms involved, including light propagation and absorption by both linear and non-linear processes. Numerous examples highlight the versatility and usefulness of the technique in the study of SEEs.
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