Journal
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Volume 58, Issue 7, Pages 1877-1886Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2010.2049768
Keywords
Covariance matrix; frequency-domain measurements; scattering parameters; time-domain measurements; uncertainty analysis; vector network analyzer (VNA)
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We develop a covariance-matrix-based uncertainty analysis for vector-network-analyzer (VNA) scattering-parameter measurements. The covariance matrix not only captures all of the measurement uncertainties of the scattering-parameter measurements, but also the statistical correlations between them. This allows the uncertainties of VNA scattering-parameter measurements to be propagated into the uncertainties of other quantities derived from scattering parameters, including temporal waveforms and circuit model parameters.
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