Journal
IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES
Volume 57, Issue 5, Pages 1237-1243Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMTT.2009.2017359
Keywords
Calibration; circuit modeling; deembedding; millimeter-wave measurement; MOSFET; S-parameters; small-signal model
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Funding
- U.S. Department of Commerce [BS123456]
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Measurement and modeling procedures to accurately extract a small-signal equivalent circuit of advanced MOSFETs up to 220 GHz are proposed. The methodology carried out goes from the vector network analyzer calibration to the simulation results using complex deembedding. Good comparisons between the measurement and the simulation data obtained using this procedure are shown up to 220 GHz.
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