Journal
IEEE TRANSACTIONS ON MEDICAL IMAGING
Volume 28, Issue 11, Pages 1688-1702Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TMI.2009.2018283
Keywords
Attenuation correction; dual-energy (DE) X-ray computed tomography (CT); low radiation dose; positron emission tomography/computed tomography (PET/CT); sinogram restoration
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Funding
- National Institute of Health [1R01CA115870]
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Dual-energy (DE) X-ray computed tomography (CT) has been found useful in various applications. In medical imaging, one promising application is using low-dose DECT for attenuation correction in positron emission tomography (PET). Existing approaches to sinogram material decomposition ignore noise characteristics and are based on logarithmic transforms, producing noisy component sinogram estimates for low-dose DECT. In this paper, we propose two novel sinogram restoration methods based on statistical models: penalized weighted least square (PWLS) and penalized likelihood (PL), yielding less noisy component sinogram estimates for low-dose DECT than classical methods. The proposed methods consequently provide more precise attenuation correction of the PET emission images than do previous methods for sinogram material decomposition with DECT. We report simulations that compare the proposed techniques and existing approaches.
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