4.7 Article

A Coarse-to-Fine Model for Rail Surface Defect Detection

Journal

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2018.2853958

Keywords

Background subtraction model (BSM); coarse-to-fine model (CTFM); defect detection; rail inspection; saliency map

Funding

  1. Beijing Natural Science Foundation [J160004]
  2. Shanghai Research Program [17511102900]

Ask authors/readers for more resources

Computer vision systems have attracted much attention in recent years for use in detecting surface defects on rails; however, accurate and efficient recognition of possible defects remains challenging due to the variations shown by defects and also noise. This paper proposes a coarse-to-fine model (CTFM) to identify defects at different scales. The model works on three scales from coarse to fine: subimage level, region level, and pixel level. At the subimage level, the background subtraction model exploits row consistency in the longitudinal direction, and strongly filters the defect-free range, leaving roughly identified subimages within which defects may exist. At the next level, the region extraction model, inspired by visual saliency models, locates definite defect regions using phase-only Fourier transforms. At the finest level, the pixel subtraction model uses pixel consistency to refine the shape of each defect. The proposed method is evaluated using Type-I and Type-II rail surface defect detection data sets and an actual rail line. The experimental results show that CTFM outperforms state-of-the-art methods according to both the pixel-level index and the defect-level index.

Authors

I am an author on this paper
Click your name to claim this paper and add it to your profile.

Reviews

Primary Rating

4.7
Not enough ratings

Secondary Ratings

Novelty
-
Significance
-
Scientific rigor
-
Rate this paper

Recommended

No Data Available
No Data Available