Journal
IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
Volume 59, Issue 12, Pages 3218-3226Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TIM.2010.2047302
Keywords
Distortions; losses; measurement; power; probe modeling
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This paper focuses on the errors affecting the estimation of power switching losses in power semiconductor devices based on integration of the voltage by current product. It is shown that the measured waveforms are not simply delayed by the probes, but some overshoots and distortions are due to the probes, which may not easily be corrected. These effects are the source of errors, particularly in fast transients. This paper shows analyses of simulation and measurements, including probe models.
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