4.6 Article

Nanoscale Bipolar and Complementary Resistive Switching Memory Based on Amorphous Carbon

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 58, Issue 11, Pages 3933-3939

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2011.2164615

Keywords

Amorphous carbon (a-C); carbon nanotube (CNT); complementary resistive switching; nonvolatile memory; resistive random access memory (RRAM); resistive switching memory

Funding

  1. Stanford Nonvolatile Memory Technology Research Initiative
  2. Stanford Graduate Fellowship
  3. O. G. Villard Engineering Fund at Stanford
  4. Research Grant Council of Hong Kong Government [HKUST 611307]
  5. Berkeley Sensor and Actuator Center
  6. World Class University
  7. National Research Foundation of Korea [R31-2011-000-10022-0] Funding Source: Korea Institute of Science & Technology Information (KISTI), National Science & Technology Information Service (NTIS)

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There has been a strong demand for developing an ultradense and low-power nonvolatile memory technology. In this paper, we present a carbon-based resistive random access memory device with a carbon nanotube (CNT) electrode. An amorphous carbon layer is sandwiched between the fast-diffusing top metal electrode and the bottom CNT electrode, exhibiting a bipolar switching behavior. The use of the CNT electrode can substantially reduce the size of the active device area. We also demonstrate a carbon-based complementary resistive switch (CRS) consisting of two back-to-back connected memory cells, providing a route to reduce the sneak current in the cross-point memory. The bit information of the CRS cell is stored in a high-resistance state, thus reducing the power consumption of the CRS memory cell. This paper provides valuable early data on the effect of electrode size scaling down to nanometer size.

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