Journal
IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 57, Issue 11, Pages 3050-3058Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2010.2069566
Keywords
AlGaN/GaN heterostructure field-effect transistor (HFET); insulating GaN (i-GaN)
Funding
- Tesat-Spacecom GmbH Co. KG
- German Aerospace Center (DLR) [50 PS 0704-UAN]
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A systematic study of GaN-based heterostructure field-effect transistors with an insulating carbon-doped GaN back barrier for high-voltage operation is presented. The impact of variations of carbon doping concentration, GaN channel thickness, and substrates is evaluated. Tradeoff considerations in ON-state resistance versus current collapse are addressed. Suppression of the OFF-state subthreshold drain-leakage currents enables a breakdown voltage enhancement of over 1000 V with a low ON-state resistance. Devices with a 5-mu m gate-drain separation on semi-insulating SiC and a 7-mu m gate-drain separation on n-SiC exhibit 938 V and 0.39 m Omega center dot cm(2) and 942 V and 0.39 m Omega center dot cm(2), respectively. A power device figure of merit of similar to 2.3 x 10(9) V-2/Omega center dot cm(2) was calculated for these devices.
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