4.6 Article

Investigation of the transport properties of silicon nanowires using deterministic and Monte Carlo approaches to the solution of the Boltzmann transport equation

Journal

IEEE TRANSACTIONS ON ELECTRON DEVICES
Volume 55, Issue 8, Pages 2086-2096

Publisher

IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TED.2008.926230

Keywords

Boltzmann transport equation; mobility; Monte Carlo; nanowires; simulation; surface roughness

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We investigate the transport properties of silicon-nanowire FETs by using two different approaches to the solution of the Boltzmann equation for the quasi-1-D electron gas, namely, the Monte Carlo method and a deterministic numerical solver. In both cases, we first solve the coupled Schrijdinger-Poisson equations to extract the profiles of the 1-D subbands along the channel; next, the coupled multisubband Boltzmann equations are tackled with the two different procedures. A very good agreement is achieved between the two approaches to the transport problem in terms of mobility, drain-current, and internal physical quantities, such as carrier-distribution functions and average velocities. Some peculiar features of the low-field mobility as a function of the wire diameter and gate bias are discussed and justified based on the subband energy and wave-function behavior within the cylindrical geometry of the nanowire, as well as the heavy degeneracy of the electron gas at large gate biases.

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