Journal
IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY
Volume 51, Issue 1, Pages 78-100Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TEMC.2008.2008907
Keywords
Emission; history; ICs; modeling; roadmap; standards; susceptibility
Funding
- French Ministry of Industry
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Throughout the decades of continuous advances in semiconductor technology, from the discrete devices of the late 1950s to today's billon-transistor system-on-chip, there have always been concerns about the ability of components to operate safely in an increasingly disruptive electromagnetic environment. This paper provides a nonexhaustive review of the research work conducted in the field of electromagnetic compatibility (EMC) at the IC level over the past 40 years. It also brings together a collection of information and trends in IC technology, in order to build a tentative roadmap for the EMC of ICs until the year 2020, with a focus on measurement methods and modeling approaches.
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