Journal
IEEE TRANSACTIONS ON COMPUTER-AIDED DESIGN OF INTEGRATED CIRCUITS AND SYSTEMS
Volume 27, Issue 7, Pages 1333-1338Publisher
IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
DOI: 10.1109/TCAD.2008.923100
Keywords
embedded testing techniques; Huffman encoding; intellectual property (IP) cores; test data compression
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A new statistical test data compression method that is suitable for IP cores of an unknown structure with multiple scan chains is proposed in this paper. Huffman, which is a well-known fixed-to-variable code, is used in this paper as a variable-to-variable code. The precomputed test set of a core is partitioned into variable-length blocks, which are, then, compressed by an efficient Huffman-based encoding procedure with a limited number of codewords. To increase the compression ratio, the same codeword can be reused for encoding compatible blocks of different sizes. Further compression improvements can be achieved by using two very simple test set transformations. A simple and low-overhead decompression architecture is also proposed.
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